Post-Production Tuning in Analog and RF Devices
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چکیده
In analog and RF device testing, current industry practice is to exhaustively test each device against its specifications, labeling as faulty any devices that do not meet those specifications. At this point, however, nothing is done with faulty devices—they are simply discarded. Although conservative design can improve yield, increasing variation due to process scaling renders this an insufficient solution. One promising solution is to make analog and RF devices capable of post-production tuning. In this work, we present recent groundwork for implementing post-production tuning of analog and RF devices, thereby improving yield by tuning devices that would otherwise be discarded. Specifically, we demonstrate a methodology for selecting the best set of “knobs” within a design, to convert parametrically faulty devices to working devices.
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تاریخ انتشار 2009